Hot Swapping causes a sudden change in the loading conditions of the system which in turn affects the current drawn. Hot-Swap circuits which are used to protect the end equipment employ an external FET which must survive the sudden stress generated from the inrush current. The selection of MOSFET for a hot-swap application is a highly iterative and time-consuming process. This report gives an overview of the concepts and calculations that need to be considered to decide the right MOSFET for the application.